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Controlling the Speededness of Assembled Test Forms: A Generalization to the Three-Parameter Lognormal Response Time Model
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Becker, Benjamin; Weirich, Sebastian; Goldhammer, Frank; Debeer, Dries – Journal of Educational Measurement, 2023
When designing or modifying a test, an important challenge is controlling its speededness. To achieve this, van der Linden (2011a, 2011b) proposed using a lognormal response time model, more specifically the two-parameter lognormal model, and automated test assembly (ATA) via mixed integer linear programming. However, this approach has a severe…
Descriptors: Test Construction, Automation, Models, Test Items