I review opportunities and threats that widely accessible Artificial Intelligence (AI)-powered services present for educational statistics and measurement. Algorithmic and computational advances continue to improve approaches to item generation, scale maintenance, test security, test scoring, and score reporting. Predictable misuses of AI for…

This article proposes an item exposure control method, which is the extension of the Sympson and Hetter procedure and can provide item exposure control at both the item and test levels. Item exposure rate and test overlap rate are two indices commonly used to track item exposure in computerized adaptive tests. By considering both indices, item…