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Lathrop, Quinn N.; Cheng, Ying – Journal of Educational Measurement, 2014
When cut scores for classifications occur on the total score scale, popular methods for estimating classification accuracy (CA) and classification consistency (CC) require assumptions about a parametric form of the test scores or about a parametric response model, such as item response theory (IRT). This article develops an approach to estimate CA…
Descriptors: Cutting Scores, Classification, Computation, Nonparametric Statistics
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Lee, Young-Sun; Wollack, James A.; Douglas, Jeffrey – Educational and Psychological Measurement, 2009
The purpose of this study was to assess the model fit of a 2PL through comparison with the nonparametric item characteristic curve (ICC) estimation procedures. Results indicate that three nonparametric procedures implemented produced ICCs that are similar to that of the 2PL for items simulated to fit the 2PL. However for misfitting items,…
Descriptors: Nonparametric Statistics, Item Response Theory, Test Items, Simulation
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Cui, Zhongmin; Kolen, Michael J. – Applied Psychological Measurement, 2008
This article considers two methods of estimating standard errors of equipercentile equating: the parametric bootstrap method and the nonparametric bootstrap method. Using a simulation study, these two methods are compared under three sample sizes (300, 1,000, and 3,000), for two test content areas (the Iowa Tests of Basic Skills Maps and Diagrams…
Descriptors: Test Length, Test Content, Simulation, Computation
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Meijer, Rob R.; And Others – Applied Psychological Measurement, 1994
The power of the nonparametric person-fit statistic, U3, is investigated through simulations as a function of item characteristics, test characteristics, person characteristics, and the group to which examinees belong. Results suggest conditions under which relatively short tests can be used for person-fit analysis. (SLD)
Descriptors: Difficulty Level, Group Membership, Item Response Theory, Nonparametric Statistics
Nandakumar, Ratna; Yu, Feng – 1994
DIMTEST is a statistical test procedure for assessing essential unidimensionality of binary test item responses. The test statistic T used for testing the null hypothesis of essential unidimensionality is a nonparametric statistic. That is, there is no particular parametric distribution assumed for the underlying ability distribution or for the…
Descriptors: Ability, Content Validity, Correlation, Nonparametric Statistics