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van der Linden, Wim J. – Applied Psychological Measurement, 1979
The restrictions on item difficulties that must be met when binomial models are applied to domain-referenced testing are examined. Both a deterministic and a stochastic conception of item responses are discussed with respect to difficulty and Guttman-type items. (Author/BH)
Descriptors: Difficulty Level, Item Sampling, Latent Trait Theory, Mathematical Models
Bernknopf, Stan; And Others – 1979
The effectiveness of a model for determining a minimal cut-off score for criterion-referenced tests was examined. The model, based upon techniques presented originally by Nedelsky and by Angoff, was first used in conjunction with a multiple choice test developed for use in certifying school counselors in Georgia. A "knowledge estimation panel" was…
Descriptors: Counselor Certification, Court Litigation, Criterion Referenced Tests, Cutting Scores