NotesFAQContact Us
Collection
Advanced
Search Tips
Source
Applied Measurement in…1
Education Level
Audience
Location
Laws, Policies, & Programs
Assessments and Surveys
What Works Clearinghouse Rating
Showing one result Save | Export
Peer reviewed Peer reviewed
Hambleton, Ronald K.; Jones, Russell W. – Applied Measurement in Education, 1994
The impact of capitalizing on chance in item selection on the accuracy of test information functions was studied through simulation, focusing on examinee sample size in item calibration and the ratio of item bank size to test length. (SLD)
Descriptors: Computer Simulation, Estimation (Mathematics), Item Banks, Item Response Theory