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Meijer, Rob R.; And Others – Applied Measurement in Education, 1996
Several existing group-based statistics to detect improbable item score patterns are discussed, along with the cut scores proposed in the literature to classify an item score pattern as aberrant. A simulation study and an empirical study are used to compare the statistics and their use and to investigate the practical use of cut scores. (SLD)
Descriptors: Achievement Tests, Classification, Cutting Scores, Identification