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Kannan, Priya; Sgammato, Adrienne; Tannenbaum, Richard J.; Katz, Irvin R. – Applied Measurement in Education, 2015
The Angoff method requires experts to view every item on the test and make a probability judgment. This can be time consuming when there are large numbers of items on the test. In this study, a G-theory framework was used to determine if a subset of items can be used to make generalizable cut-score recommendations. Angoff ratings (i.e.,…
Descriptors: Reliability, Standard Setting (Scoring), Cutting Scores, Test Items

Feldt, Leonard S. – Applied Measurement in Education, 2002
Considers the degree of bias in testlet-based alpha (internal consistency reliability) through hypothetical examples and real test data from four tests of the Iowa Tests of Basic Skills. Presents a simple formula for computing a testlet-based congeneric coefficient. (SLD)
Descriptors: Estimation (Mathematics), Reliability, Statistical Bias, Test Format

Fitzpatrick, Anne R.; Yen, Wendy M. – Applied Measurement in Education, 2001
Examined the effects of test length and sample size on the alternate forms reliability and equating of simulated mathematics tests composed of constructed response items scaled using the two-parameter partial credit model. Results suggest that, to obtain acceptable reliabilities and accurate equated scores, tests should have at least 8 6-point…
Descriptors: Constructed Response, Equated Scores, Mathematics Tests, Reliability

Yen, Wendy M.; Candell, Gregory L. – Applied Measurement in Education, 1991
Empirical reliabilities of scores based on item-pattern scoring, using 3-parameter item-response theory and number-correct scoring, were compared within each of 5 score metrics for at least 900 elementary school students for 5 content areas. Average increases in reliability were produced by item-pattern scoring. (SLD)
Descriptors: Elementary Education, Elementary School Students, Grade Equivalent Scores, Item Response Theory