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Lee, HyeSun – Applied Measurement in Education, 2018
The current simulation study examined the effects of Item Parameter Drift (IPD) occurring in a short scale on parameter estimates in multilevel models where scores from a scale were employed as a time-varying predictor to account for outcome scores. Five factors, including three decisions about IPD, were considered for simulation conditions. It…
Descriptors: Test Items, Hierarchical Linear Modeling, Predictor Variables, Scores
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Yen, Wendy M.; Candell, Gregory L. – Applied Measurement in Education, 1991
Empirical reliabilities of scores based on item-pattern scoring, using 3-parameter item-response theory and number-correct scoring, were compared within each of 5 score metrics for at least 900 elementary school students for 5 content areas. Average increases in reliability were produced by item-pattern scoring. (SLD)
Descriptors: Elementary Education, Elementary School Students, Grade Equivalent Scores, Item Response Theory
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Wise, Steven L. – Applied Measurement in Education, 2006
In low-stakes testing, the motivation levels of examinees are often a matter of concern to test givers because a lack of examinee effort represents a direct threat to the validity of the test data. This study investigated the use of response time to assess the amount of examinee effort received by individual test items. In 2 studies, it was found…
Descriptors: Computer Assisted Testing, Motivation, Test Validity, Item Response Theory
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Linn, Robert L.; Hambleton, Ronald K. – Applied Measurement in Education, 1991
Four main approaches to customized testing are described, and their resulting scores' valid uses and interpretations are discussed. Customized testing can yield valid normative and curriculum-specific information, although cautious application is needed to avoid misleading inferences about student achievement. (SLD)
Descriptors: Academic Achievement, Accountability, Criterion Referenced Tests, Curriculum