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Stefanie A. Wind; Benjamin Lugu – Applied Measurement in Education, 2024
Researchers who use measurement models for evaluation purposes often select models with stringent requirements, such as Rasch models, which are parametric. Mokken Scale Analysis (MSA) offers a theory-driven nonparametric modeling approach that may be more appropriate for some measurement applications. Researchers have discussed using MSA as a…
Descriptors: Item Response Theory, Data Analysis, Simulation, Nonparametric Statistics
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Abulela, Mohammed A. A.; Rios, Joseph A. – Applied Measurement in Education, 2022
When there are no personal consequences associated with test performance for examinees, rapid guessing (RG) is a concern and can differ between subgroups. To date, the impact of differential RG on item-level measurement invariance has received minimal attention. To that end, a simulation study was conducted to examine the robustness of the…
Descriptors: Comparative Analysis, Robustness (Statistics), Nonparametric Statistics, Item Analysis
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Sinharay, Sandip – Applied Measurement in Education, 2017
Karabatsos compared the power of 36 person-fit statistics using receiver operating characteristics curves and found the "H[superscript T]" statistic to be the most powerful in identifying aberrant examinees. He found three statistics, "C", "MCI", and "U3", to be the next most powerful. These four statistics,…
Descriptors: Nonparametric Statistics, Goodness of Fit, Simulation, Comparative Analysis
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Wells, Craig S.; Bolt, Daniel M. – Applied Measurement in Education, 2008
Tests of model misfit are often performed to validate the use of a particular model in item response theory. Douglas and Cohen (2001) introduced a general nonparametric approach for detecting misfit under the two-parameter logistic model. However, the statistical properties of their approach, and empirical comparisons to other methods, have not…
Descriptors: Test Length, Test Items, Monte Carlo Methods, Nonparametric Statistics
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Mroch, Andrew A.; Bolt, Daniel M. – Applied Measurement in Education, 2006
Recently, nonparametric methods have been proposed that provide a dimensionally based description of test structure for tests with dichotomous items. Because such methods are based on different notions of dimensionality than are assumed when using a psychometric model, it remains unclear whether these procedures might lead to a different…
Descriptors: Simulation, Comparative Analysis, Psychometrics, Methods Research
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Meijer, Rob R.; And Others – Applied Measurement in Education, 1996
Several existing group-based statistics to detect improbable item score patterns are discussed, along with the cut scores proposed in the literature to classify an item score pattern as aberrant. A simulation study and an empirical study are used to compare the statistics and their use and to investigate the practical use of cut scores. (SLD)
Descriptors: Achievement Tests, Classification, Cutting Scores, Identification