
ERIC Number: EJ511024
Record Type: Journal
Publication Date: 1995
Pages: N/A
Abstractor: N/A
ISBN: N/A
ISSN: ISSN-0895-7347
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Available Date: N/A
Detection of Aberrant Item Score Patterns: A Review of Recent Developments.
Meijer, Rob R.; Sijtsma, Klaas
Applied Measurement in Education, v8 n3 p261-72 1995
Methods for detecting item score patterns that are unlikely, given that a parametric item response theory model gives an adequate description of the data or given the responses of other persons in the group, are discussed. The use of person-fit statistics in empirical data analysis is briefly discussed. (SLD)
Publication Type: Reports - Evaluative; Journal Articles
Education Level: N/A
Audience: N/A
Language: English
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