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Okada, Kensuke; Shigemasu, Kazuo – Applied Psychological Measurement, 2009
Bayesian multidimensional scaling (MDS) has attracted a great deal of attention because: (1) it provides a better fit than do classical MDS and ALSCAL; (2) it provides estimation errors of the distances; and (3) the Bayesian dimension selection criterion, MDSIC, provides a direct indication of optimal dimensionality. However, Bayesian MDS is not…
Descriptors: Bayesian Statistics, Multidimensional Scaling, Computation, Computer Software
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Johnson, Matthew S.; Sinharay, Sandip – Applied Psychological Measurement, 2005
For complex educational assessments, there is an increasing use of item families, which are groups of related items. Calibration or scoring in an assessment involving item families requires models that can take into account the dependence structure inherent among the items that belong to the same item family. This article extends earlier works in…
Descriptors: National Competency Tests, Markov Processes, Bayesian Statistics
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Glas, Cees A. W.; Meijer, Rob R. – Applied Psychological Measurement, 2003
Presents a Bayesian approach to the evaluation of person fit in item response theory (IRT) models. Works the procedure in detail for the three parameter normal ogive model, but shows that the procedure can be generalized to many other IRT models. (SLD)
Descriptors: Bayesian Statistics, Goodness of Fit, Item Response Theory, Models
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van der Linden, Wim J. – Applied Psychological Measurement, 1999
Proposes a procedure for empirical initialization of the trait (theta) estimator in adaptive testing that is based on the statistical relation between theta and background variables known prior to test administration. Illustrates the procedure for an adaptive version of a test from the Dutch General Aptitude Battery. (SLD)
Descriptors: Adaptive Testing, Aptitude Tests, Bayesian Statistics, Computer Assisted Testing