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Applied Psychological… | 4 |
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van Krimpen-Stoop, Edith M.… | 2 |
Hirsch, Thomas M. | 1 |
Luecht, Richard M. | 1 |
Meijer, Rob | 1 |
Meijer, Rob R. | 1 |
Nering, Michael L. | 1 |
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van Krimpen-Stoop, Edith M. L. A.; Meijer, Rob R. – Applied Psychological Measurement, 2002
Compared the nominal and empirical null distributions of the standardized log-likelihood statistic for polytomous items for paper-and-pencil (P&P) and computerized adaptive tests (CATs). Results show that the empirical distribution of the statistic differed from the assumed standard normal distribution for both P&P tests and CATs. Also…
Descriptors: Adaptive Testing, Computer Assisted Testing, Item Response Theory, Statistical Distributions

van Krimpen-Stoop, Edith M. L. A.; Meijer, Rob – Applied Psychological Measurement, 1999
Theoretical null distributions of several fit statistic have been derived for paper-and-pencil tests. Examined whether these distributions also hold for computerized adaptive tests through simulation. Rates for two statistics studied were found to be similar in most cases. (SLD)
Descriptors: Adaptive Testing, Computer Assisted Testing, Goodness of Fit, Item Response Theory

Nering, Michael L. – Applied Psychological Measurement, 1997
Evaluated the distribution of person fit within the computerized-adaptive testing (CAT) environment through simulation. Found that, within the CAT environment, these indexes tend not to follow a standard normal distribution. Person fit indexes had means and standard deviations that were quite different from the expected. (SLD)
Descriptors: Adaptive Testing, Computer Assisted Testing, Error of Measurement, Item Response Theory

Luecht, Richard M.; Hirsch, Thomas M. – Applied Psychological Measurement, 1992
Derivations of several item selection algorithms for use in fitting test items to target information functions (IFs) are described. These algorithms, which use an average growth approximation of target IFs, were tested by generating six test forms and were found to provide reliable fit. (SLD)
Descriptors: Algorithms, Computer Assisted Testing, Equations (Mathematics), Goodness of Fit