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de la Torre, Jimmy; Hong, Yuan – Applied Psychological Measurement, 2010
Sample size ranks as one of the most important factors that affect the item calibration task. However, due to practical concerns (e.g., item exposure) items are typically calibrated with much smaller samples than what is desired. To address the need for a more flexible framework that can be used in small sample item calibration, this article…
Descriptors: Sample Size, Markov Processes, Tests, Data Analysis
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de la Torre, Jimmy; Song, Hao – Applied Psychological Measurement, 2009
Assessments consisting of different domains (e.g., content areas, objectives) are typically multidimensional in nature but are commonly assumed to be unidimensional for estimation purposes. The different domains of these assessments are further treated as multi-unidimensional tests for the purpose of obtaining diagnostic information. However, when…
Descriptors: Ability, Tests, Item Response Theory, Data Analysis
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de la Torre, Jimmy – Applied Psychological Measurement, 2008
Recent work has shown that multidimensionally scoring responses from different tests can provide better ability estimates. For educational assessment data, applications of this approach have been limited to binary scores. Of the different variants, the de la Torre and Patz model is considered more general because implementing the scoring procedure…
Descriptors: Markov Processes, Scoring, Data Analysis, Item Response Theory
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Belov, Dmitry I.; Armstrong, Ronald D. – Applied Psychological Measurement, 2005
A new test assembly algorithm based on a Monte Carlo random search is presented in this article. A major advantage of the Monte Carlo test assembly over other approaches (integer programming or enumerative heuristics) is that it performs a uniform sampling from the item pool, which provides every feasible item combination (test) with an equal…
Descriptors: Item Banks, Computer Assisted Testing, Monte Carlo Methods, Evaluation Methods