Descriptor
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Applied Psychological… | 5 |
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van der Linden, Wim J. | 2 |
Armstrong, R. D. | 1 |
Berger, Martijn P. F. | 1 |
Schnipke, Deborah L. | 1 |
Scrams, David J. | 1 |
van der Linden, Wim J., Ed. | 1 |
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Journal Articles | 5 |
Reports - Evaluative | 3 |
Collected Works - Serials | 1 |
Reports - Descriptive | 1 |
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Armed Services Vocational… | 2 |
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Law School Admission Test | 1 |
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van der Linden, Wim J. – Applied Psychological Measurement, 2001
Presents a constrained computerized adaptive testing (CAT) algorithm that can be used to equate CAT number-correct scores to a reference test. Used an item bank from the Law School Admission Test to compare results of the algorithm with those for equipercentile observed-score equating. Discusses advantages of the approach. (SLD)
Descriptors: Adaptive Testing, Algorithms, Computer Assisted Testing, Equated Scores

van der Linden, Wim J.; Scrams, David J.; Schnipke, Deborah L. – Applied Psychological Measurement, 1999
Proposes an item-selection algorithm for neutralizing the differential effects of time limits on computerized adaptive test scores. Uses a statistical model for distributions of examinees' response times on items in a bank that is updated each time an item is administered. Demonstrates the method using an item bank from the Armed Services…
Descriptors: Adaptive Testing, Algorithms, Computer Assisted Testing, Item Banks

Berger, Martijn P. F. – Applied Psychological Measurement, 1994
This paper focuses on similarities of optimal design of fixed-form tests, adaptive tests, and testlets within the framework of the general theory of optimal designs. A sequential design procedure is proposed that uses these similarities to obtain consistent estimates for the trait level distribution. (SLD)
Descriptors: Achievement Tests, Adaptive Testing, Algorithms, Estimation (Mathematics)

Armstrong, R. D.; And Others – Applied Psychological Measurement, 1996
When the network-flow algorithm (NFA) and the average growth approximation algorithm (AGAA) were used for automated test assembly with American College Test and Armed Services Vocational Aptitude Battery item banks, results indicate that reasonable error in item parameters is not harmful for test assembly using NFA or AGAA. (SLD)
Descriptors: Algorithms, Aptitude Tests, College Entrance Examinations, Computer Assisted Testing

van der Linden, Wim J., Ed. – Applied Psychological Measurement, 1986
New theory and practice in testing is replacing the standard test by the test item bank and classical test theory by item response theory. Eight papers and a commentary are presented in this special issue concerning test item banking. (SLD)
Descriptors: Adaptive Testing, Algorithms, Bayesian Statistics, Computer Assisted Testing