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Leucht, Richard M. – Applied Psychological Measurement, 1998
Presents a variation of a "greedy" algorithm that can be used in test-assembly problems. The algorithm, the normalized weighted absolute-deviation heuristic, selects items to have a locally optimal fit to a moving set of average criterion values. Demonstrates application of the model. (SLD)
Descriptors: Algorithms, Computer Assisted Testing, Criteria, Heuristics

Sanders, Piet F.; Verschoor, Alfred J. – Applied Psychological Measurement, 1998
Presents minimization and maximization models for parallel test construction under constraints. The minimization model constructs weakly and strongly parallel tests of minimum length, while the maximization model constructs weakly and strongly parallel tests with maximum test reliability. (Author/SLD)
Descriptors: Algorithms, Models, Reliability, Test Construction

Berger, Martijn P. F. – Applied Psychological Measurement, 1994
This paper focuses on similarities of optimal design of fixed-form tests, adaptive tests, and testlets within the framework of the general theory of optimal designs. A sequential design procedure is proposed that uses these similarities to obtain consistent estimates for the trait level distribution. (SLD)
Descriptors: Achievement Tests, Adaptive Testing, Algorithms, Estimation (Mathematics)

Stocking, Martha L.; And Others – Applied Psychological Measurement, 1993
A method of automatically selecting items for inclusion in a test with constraints on item content and statistical properties was applied to real data. Tests constructed manually from the same data and constraints were compared to tests constructed automatically. Results show areas in which automated assembly can improve test construction. (SLD)
Descriptors: Algorithms, Automation, Comparative Testing, Computer Assisted Testing

Armstrong, R. D.; And Others – Applied Psychological Measurement, 1996
When the network-flow algorithm (NFA) and the average growth approximation algorithm (AGAA) were used for automated test assembly with American College Test and Armed Services Vocational Aptitude Battery item banks, results indicate that reasonable error in item parameters is not harmful for test assembly using NFA or AGAA. (SLD)
Descriptors: Algorithms, Aptitude Tests, College Entrance Examinations, Computer Assisted Testing

Armstrong, Ronald D.; Jones, Douglas H. – Applied Psychological Measurement, 1992
Polynomial algorithms are presented that are used to solve selected problems in test theory, and computational results from sample problems with several hundred decision variables are provided that demonstrate the benefits of these algorithms. The algorithms are based on optimization theory in networks (graphs). (SLD)
Descriptors: Algorithms, Decision Making, Equations (Mathematics), Mathematical Models

Swanson, Len; Stocking, Martha L. – Applied Psychological Measurement, 1993
A model for solving very large item selection problems is presented. The model builds on binary programming applied to test construction. A heuristic for selecting items that satisfy the constraints in the model is also presented, and various problems are solved using the model and heuristic. (SLD)
Descriptors: Algorithms, Equations (Mathematics), Heuristics, Item Response Theory

Stocking, Martha L.; Swanson, Len – Applied Psychological Measurement, 1993
A method is presented for incorporating a large number of constraints on adaptive item selection in the construction of computerized adaptive tests. The method, which emulates practices of expert test specialists, is illustrated for verbal and quantitative measures. Its foundation is application of a weighted deviations model and algorithm. (SLD)
Descriptors: Adaptive Testing, Algorithms, Computer Assisted Testing, Expert Systems

Reise, Steven P.; Due, Allan M. – Applied Psychological Measurement, 1991
Previous person-fit research is extended through explication of an unexplored model for generating aberrant response patterns. The proposed model is then implemented to investigate the influence of test properties on the aberrancy detection power of a person-fit statistic. Difficulties of aberrancy detection are discussed. (SLD)
Descriptors: Algorithms, Computer Simulation, Item Response Theory, Mathematical Models

van der Linden, Wim J., Ed. – Applied Psychological Measurement, 1986
New theory and practice in testing is replacing the standard test by the test item bank and classical test theory by item response theory. Eight papers and a commentary are presented in this special issue concerning test item banking. (SLD)
Descriptors: Adaptive Testing, Algorithms, Bayesian Statistics, Computer Assisted Testing

Luecht, Richard M.; Hirsch, Thomas M. – Applied Psychological Measurement, 1992
Derivations of several item selection algorithms for use in fitting test items to target information functions (IFs) are described. These algorithms, which use an average growth approximation of target IFs, were tested by generating six test forms and were found to provide reliable fit. (SLD)
Descriptors: Algorithms, Computer Assisted Testing, Equations (Mathematics), Goodness of Fit