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Zeng, Lingjia – Applied Psychological Measurement, 1997
Proposes a marginal Bayesian estimation procedure to improve item parameter estimates for the three parameter logistic model. Computer simulation suggests that implementing the marginal Bayesian estimation algorithm with four-parameter beta prior distributions and then updating the priors with empirical means of updated intermediate estimates can…
Descriptors: Algorithms, Bayesian Statistics, Estimation (Mathematics), Statistical Distributions
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Eggen, T. J. H. M. – Applied Psychological Measurement, 1999
Evaluates a method for item selection in adaptive testing that is based on Kullback-Leibler information (KLI) (T. Cover and J. Thomas, 1991). Simulation study results show that testing algorithms using KLI-based item selection perform better than or as well as those using Fisher information item selection. (SLD)
Descriptors: Adaptive Testing, Algorithms, Computer Assisted Testing, Selection
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van der Linden, Wim J.; Scrams, David J.; Schnipke, Deborah L. – Applied Psychological Measurement, 1999
Proposes an item-selection algorithm for neutralizing the differential effects of time limits on computerized adaptive test scores. Uses a statistical model for distributions of examinees' response times on items in a bank that is updated each time an item is administered. Demonstrates the method using an item bank from the Armed Services…
Descriptors: Adaptive Testing, Algorithms, Computer Assisted Testing, Item Banks
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Stocking, Martha L.; And Others – Applied Psychological Measurement, 1993
A method of automatically selecting items for inclusion in a test with constraints on item content and statistical properties was applied to real data. Tests constructed manually from the same data and constraints were compared to tests constructed automatically. Results show areas in which automated assembly can improve test construction. (SLD)
Descriptors: Algorithms, Automation, Comparative Testing, Computer Assisted Testing
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Armstrong, R. D.; And Others – Applied Psychological Measurement, 1996
When the network-flow algorithm (NFA) and the average growth approximation algorithm (AGAA) were used for automated test assembly with American College Test and Armed Services Vocational Aptitude Battery item banks, results indicate that reasonable error in item parameters is not harmful for test assembly using NFA or AGAA. (SLD)
Descriptors: Algorithms, Aptitude Tests, College Entrance Examinations, Computer Assisted Testing
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Armstrong, Ronald D.; Jones, Douglas H. – Applied Psychological Measurement, 1992
Polynomial algorithms are presented that are used to solve selected problems in test theory, and computational results from sample problems with several hundred decision variables are provided that demonstrate the benefits of these algorithms. The algorithms are based on optimization theory in networks (graphs). (SLD)
Descriptors: Algorithms, Decision Making, Equations (Mathematics), Mathematical Models
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Swanson, Len; Stocking, Martha L. – Applied Psychological Measurement, 1993
A model for solving very large item selection problems is presented. The model builds on binary programming applied to test construction. A heuristic for selecting items that satisfy the constraints in the model is also presented, and various problems are solved using the model and heuristic. (SLD)
Descriptors: Algorithms, Equations (Mathematics), Heuristics, Item Response Theory
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Stocking, Martha L.; Swanson, Len – Applied Psychological Measurement, 1993
A method is presented for incorporating a large number of constraints on adaptive item selection in the construction of computerized adaptive tests. The method, which emulates practices of expert test specialists, is illustrated for verbal and quantitative measures. Its foundation is application of a weighted deviations model and algorithm. (SLD)
Descriptors: Adaptive Testing, Algorithms, Computer Assisted Testing, Expert Systems
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Bock, R. Darrell; And Others – Applied Psychological Measurement, 1988
A method of item factor analysis is described, which is based on Thurstone's multiple-factor model and implemented by marginal maximum likelihood estimation and the EM algorithm. Also assessed are the statistical significance of successive factors added to the model, provisions for guessing and omitted items, and Bayes constraints. (TJH)
Descriptors: Algorithms, Bayesian Statistics, Equations (Mathematics), Estimation (Mathematics)
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van der Linden, Wim J., Ed. – Applied Psychological Measurement, 1986
New theory and practice in testing is replacing the standard test by the test item bank and classical test theory by item response theory. Eight papers and a commentary are presented in this special issue concerning test item banking. (SLD)
Descriptors: Adaptive Testing, Algorithms, Bayesian Statistics, Computer Assisted Testing
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Luecht, Richard M.; Hirsch, Thomas M. – Applied Psychological Measurement, 1992
Derivations of several item selection algorithms for use in fitting test items to target information functions (IFs) are described. These algorithms, which use an average growth approximation of target IFs, were tested by generating six test forms and were found to provide reliable fit. (SLD)
Descriptors: Algorithms, Computer Assisted Testing, Equations (Mathematics), Goodness of Fit
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Rost, Jurgen – Applied Psychological Measurement, 1990
Combining Rasch and latent class models is presented as a way to overcome deficiencies and retain the positive features of both. An estimation algorithm is outlined, providing conditional maximum likelihood estimates of item parameters for each class. The model is illustrated with simulated data and real data (n=869 adults). (SLD)
Descriptors: Adults, Algorithms, Computer Simulation, Equations (Mathematics)
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Kim, Seock-Ho; And Others – Applied Psychological Measurement, 1994
Type I error rates of F. M. Lord's chi square test for differential item functioning were investigated using Monte Carlo simulations with marginal maximum likelihood estimation and marginal Bayesian estimation algorithms. Lord's chi square did not provide useful Type I error control for the three-parameter logistic model at these sample sizes.…
Descriptors: Algorithms, Bayesian Statistics, Chi Square, Error of Measurement