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Applied Psychological… | 4 |
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Goh, David S. | 1 |
Kleinke, David J. | 1 |
Lord, Frederic M. | 1 |
Mellenbergh, Gideon J. | 1 |
van der Linden, Wim J. | 1 |
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Journal Articles | 3 |
Reports - Research | 3 |
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Kleinke, David J. – Applied Psychological Measurement, 1979
Lord's, Millman's and Saupe's methods of approximating the standard error of measurement are reviewed. Through an empirical demonstration involving 200 university classroom tests, all three approximations are shown to be biased. (Author/JKS)
Descriptors: Error of Measurement, Error Patterns, Higher Education, Mathematical Formulas

Mellenbergh, Gideon J.; van der Linden, Wim J. – Applied Psychological Measurement, 1979
For six tests, coefficient delta as an index for internal optimality is computed. Internal optimality is defined as the magnitude of risk of the decision procedure with respect to the true score. Results are compared with an alternative index (coefficient kappa) for assessing the consistency of decisions. (Author/JKS)
Descriptors: Classification, Comparative Analysis, Decision Making, Error of Measurement

Goh, David S. – Applied Psychological Measurement, 1979
The advantages of using psychometric thoery to design short forms of intelligence tests are demonstrated by comparing such usage to a systematic random procedure that has previously been used. The Wechsler Intelligence Scale for Children Revised (WISC-R) Short Form is presented as an example. (JKS)
Descriptors: Elementary Secondary Education, Intelligence Tests, Item Analysis, Psychometrics

Lord, Frederic M. – Applied Psychological Measurement, 1977
Under given conditions, conventional testing and computer-generated repeatable testing (CGRT) are equally effective for estimating examinee ability; CGRT is more effective for estimating the mean ability level of a group and less effective for estimating ability differences among individuals. These conclusion are drawn from domain-referenced test…
Descriptors: Career Development, Computer Assisted Testing, Difficulty Level, Group Norms