NotesFAQContact Us
Collection
Advanced
Search Tips
Back to results
Peer reviewed Peer reviewed
ERIC Number: EJ594318
Record Type: Journal
Publication Date: 1998
Pages: N/A
Abstractor: N/A
ISBN: N/A
ISSN: ISSN-0146-6216
EISSN: N/A
Available Date: N/A
Parallel Test Construction Using Classical Item Parameters.
Sanders, Piet F.; Verschoor, Alfred J.
Applied Psychological Measurement, v22 n3 p212-23 Sep 1998
Presents minimization and maximization models for parallel test construction under constraints. The minimization model constructs weakly and strongly parallel tests of minimum length, while the maximization model constructs weakly and strongly parallel tests with maximum test reliability. (Author/SLD)
Publication Type: Journal Articles; Reports - Descriptive
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A
Author Affiliations: N/A