Educational assessments often require uniform test forms, for which each test form has equivalent measurement accuracy but with a different set of items. For uniform test assembly, an important issue is the increase of the number of assembled uniform tests. Although many automatic uniform test assembly methods exist, the maximum clique algorithm…

Educational assessments occasionally require uniform test forms for which each test form comprises a different set of items, but the forms meet equivalent test specifications (i.e., qualities indicated by test information functions based on item response theory). We propose two maximum clique algorithms (MCA) for uniform test form assembly. The…