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Fuchimoto, Kazuma; Ishii, Takatoshi; Ueno, Maomi – IEEE Transactions on Learning Technologies, 2022
Educational assessments often require uniform test forms, for which each test form has equivalent measurement accuracy but with a different set of items. For uniform test assembly, an important issue is the increase of the number of assembled uniform tests. Although many automatic uniform test assembly methods exist, the maximum clique algorithm…
Descriptors: Simulation, Efficiency, Test Items, Educational Assessment
Ishii, Takatoshi; Songmuang, Pokpong; Ueno, Maomi – IEEE Transactions on Learning Technologies, 2014
Educational assessments occasionally require uniform test forms for which each test form comprises a different set of items, but the forms meet equivalent test specifications (i.e., qualities indicated by test information functions based on item response theory). We propose two maximum clique algorithms (MCA) for uniform test form assembly. The…
Descriptors: Simulation, Efficiency, Test Items, Educational Assessment
Nguyen, M. L.; Hui, Siu Cheung; Fong, A. C. M. – IEEE Transactions on Learning Technologies, 2013
Web-based testing has become a ubiquitous self-assessment method for online learning. One useful feature that is missing from today's web-based testing systems is the reliable capability to fulfill different assessment requirements of students based on a large-scale question data set. A promising approach for supporting large-scale web-based…
Descriptors: Computer Assisted Testing, Test Construction, Student Evaluation, Programming

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