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Sykes, Robert C.; Yen, Wendy M. – Journal of Educational Measurement, 2000
Investigated how well the generalized and Rasch models described item and test performance across a broad range of mixed-item-format test configurations (six tests from two state proficiency testing programs). Evaluating the impact of model assumptions on the predictions of item and test information permitted a delineation of the implications of…
Descriptors: Achievement Tests, Elementary Secondary Education, Prediction, Scaling

Yen, Wendy M. – Journal of Educational Measurement, 1986
Two methods of constucting equal-interval scales for educational achievement are discussed: Thurstone's absolute scaling method and Item Response Theory. Alternative criteria for choosing a scale are contrasted. It is argued that clearer criteria are needed for judging the appropriateness and usefulness of alternative scaling procedures.…
Descriptors: Achievement Tests, Latent Trait Theory, Mathematical Models, Scaling
The Extent, Causes and Importance of Context Effects on Item Parameters for Two Latent Trait Models.

Yen, Wendy M. – Journal of Educational Measurement, 1980
A study of the context effects on item parameters for one- and three-parameter latent trait models showed that: (1) changes in context affected their item difficulties; and (2) context effects were more important in making predictions for single items than for groups of items. (Author/RL)
Descriptors: Achievement Tests, Context Effect, Difficulty Level, Grade 4

Yen, Wendy M. – Journal of Educational Measurement, 1984
A procedure for obtaining maximum likelihood trait estimates from number-correct (NC) scores for the three-parameter logistic model is presented. It produces an NC score to trait estimate conversion table. Analyses in the estimated true score metric confirm the conclusions made in the trait metric. (Author/DWH)
Descriptors: Achievement Tests, Error of Measurement, Estimation (Mathematics), Latent Trait Theory