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Hsu, Chia-Ling; Wang, Wen-Chung – Journal of Educational Measurement, 2015
Cognitive diagnosis models provide profile information about a set of latent binary attributes, whereas item response models yield a summary report on a latent continuous trait. To utilize the advantages of both models, higher order cognitive diagnosis models were developed in which information about both latent binary attributes and latent…
Descriptors: Computer Assisted Testing, Adaptive Testing, Models, Cognitive Measurement
Finkelman, Matthew; Kim, Wonsuk; Roussos, Louis A. – Journal of Educational Measurement, 2009
Much recent psychometric literature has focused on cognitive diagnosis models (CDMs), a promising class of instruments used to measure the strengths and weaknesses of examinees. This article introduces a genetic algorithm to perform automated test assembly alongside CDMs. The algorithm is flexible in that it can be applied whether the goal is to…
Descriptors: Identification, Genetics, Test Construction, Mathematics
Almond, Russell G.; DiBello, Louis V.; Moulder, Brad; Zapata-Rivera, Juan-Diego – Journal of Educational Measurement, 2007
This paper defines Bayesian network models and examines their applications to IRT-based cognitive diagnostic modeling. These models are especially suited to building inference engines designed to be synchronous with the finer grained student models that arise in skills diagnostic assessment. Aspects of the theory and use of Bayesian network models…
Descriptors: Inferences, Models, Item Response Theory, Cognitive Measurement