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Zhang, Xue; Tao, Jian; Wang, Chun; Shi, Ning-Zhong – Journal of Educational Measurement, 2019
Model selection is important in any statistical analysis, and the primary goal is to find the preferred (or most parsimonious) model, based on certain criteria, from a set of candidate models given data. Several recent publications have employed the deviance information criterion (DIC) to do model selection among different forms of multilevel item…
Descriptors: Bayesian Statistics, Item Response Theory, Measurement, Models
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Debeer, Dries; Janssen, Rianne; De Boeck, Paul – Journal of Educational Measurement, 2017
When dealing with missing responses, two types of omissions can be discerned: items can be skipped or not reached by the test taker. When the occurrence of these omissions is related to the proficiency process the missingness is nonignorable. The purpose of this article is to present a tree-based IRT framework for modeling responses and omissions…
Descriptors: Item Response Theory, Test Items, Responses, Testing Problems
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Jin, Kuan-Yu; Wang, Wen-Chung – Journal of Educational Measurement, 2014
Sometimes, test-takers may not be able to attempt all items to the best of their ability (with full effort) due to personal factors (e.g., low motivation) or testing conditions (e.g., time limit), resulting in poor performances on certain items, especially those located toward the end of a test. Standard item response theory (IRT) models fail to…
Descriptors: Student Evaluation, Item Response Theory, Models, Simulation
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Wang, Wen-Chung; Jin, Kuan-Yu; Qiu, Xue-Lan; Wang, Lei – Journal of Educational Measurement, 2012
In some tests, examinees are required to choose a fixed number of items from a set of given items to answer. This practice creates a challenge to standard item response models, because more capable examinees may have an advantage by making wiser choices. In this study, we developed a new class of item response models to account for the choice…
Descriptors: Item Response Theory, Test Items, Selection, Models
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Finkelman, Matthew; Kim, Wonsuk; Roussos, Louis A. – Journal of Educational Measurement, 2009
Much recent psychometric literature has focused on cognitive diagnosis models (CDMs), a promising class of instruments used to measure the strengths and weaknesses of examinees. This article introduces a genetic algorithm to perform automated test assembly alongside CDMs. The algorithm is flexible in that it can be applied whether the goal is to…
Descriptors: Identification, Genetics, Test Construction, Mathematics
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Briggs, Derek C.; Wilson, Mark – Journal of Educational Measurement, 2007
An approach called generalizability in item response modeling (GIRM) is introduced in this article. The GIRM approach essentially incorporates the sampling model of generalizability theory (GT) into the scaling model of item response theory (IRT) by making distributional assumptions about the relevant measurement facets. By specifying a random…
Descriptors: Markov Processes, Generalizability Theory, Item Response Theory, Computation
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Reise, Steve P.; Yu, Jiayuan – Journal of Educational Measurement, 1990
Parameter recovery in the graded-response model was investigated using the MULTILOG computer program under default conditions. Results from 36 simulated data sets suggest that at least 500 examinees are needed to achieve adequate calibration under the graded model. Sample size had little influence on the true ability parameter's recovery. (SLD)
Descriptors: Computer Assisted Testing, Computer Simulation, Computer Software, Estimation (Mathematics)