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Frederickx, Sofie; Tuerlinckx, Francis; De Boeck, Paul; Magis, David – Journal of Educational Measurement, 2010
In this paper we present a new methodology for detecting differential item functioning (DIF). We introduce a DIF model, called the random item mixture (RIM), that is based on a Rasch model with random item difficulties (besides the common random person abilities). In addition, a mixture model is assumed for the item difficulties such that the…
Descriptors: Test Bias, Models, Test Items, Difficulty Level
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Cohen, Jon; Snow, Stephanie – Journal of Educational Measurement, 2002
Studied the impact of changes in item difficulty on National Assessment of Educational Progress (NAEP) estimates over time through a Monte Carlo study that simulated the responses of 1990 NAEP mathematics respondents to 1990 and 1996 NAEP mathematics items. Results support the idea that these changes have not affected the NAEP trend line.…
Descriptors: Change, Difficulty Level, Estimation (Mathematics), Mathematics Tests