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Direct linkKim, Hyung Jin; Lee, Won-Chan – Journal of Educational Measurement, 2022
Orlando and Thissen (2000) introduced the "S - X[superscript 2]" item-fit index for testing goodness-of-fit with dichotomous item response theory (IRT) models. This study considers and evaluates an alternative approach for computing "S - X[superscript 2]" values and other factors associated with collapsing tables of observed…
Descriptors: Goodness of Fit, Test Items, Item Response Theory, Computation
Hou, Likun; de la Torre, Jimmy; Nandakumar, Ratna – Journal of Educational Measurement, 2014
Analyzing examinees' responses using cognitive diagnostic models (CDMs) has the advantage of providing diagnostic information. To ensure the validity of the results from these models, differential item functioning (DIF) in CDMs needs to be investigated. In this article, the Wald test is proposed to examine DIF in the context of CDMs. This study…
Descriptors: Test Bias, Models, Simulation, Error Patterns
Peer reviewedHamilton, Lawrence C. – Journal of Educational Measurement, 1981
Errors in self-reports of three academic performance measures are analyzed. Empirical errors are shown to depart radically from both no-error and random-error assumptions. Self-reports by females depart farther from the no-error and random-error models for all three performance measures. (Author/BW)
Descriptors: Academic Achievement, Error Patterns, Grade Point Average, Models
Peer reviewedSmith, Malbert, III; And Others – Journal of Educational Measurement, 1979
Results of multiple-choice tests in educational psychology were examined to discover the effects on students' scores of changing their original answer choices after reconsideration. Eighty-six percent of the students changed one or more answers, and six out of seven students who made changes improved their scores by doing so. (Author/CTM)
Descriptors: Academic Ability, Difficulty Level, Error Patterns, Guessing (Tests)
