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Rowley, Glenn L.; Traub, Ross E. – Journal of Educational Measurement, 1977
The consequences of formula scoring versus number right scoring are examined in relation to the assumptions commonly made about the behavior of examinees in testing situations. The choice between the two is shown to be dependent upon having reduced error variance or unbiasedness as a goal. (Author/JKS)
Descriptors: Error of Measurement, Scoring Formulas, Statistical Bias, Test Wiseness
Peer reviewed Peer reviewed
Livingston, Samuel A. – Journal of Educational Measurement, 1982
For tests used to make pass/fail decisions, the relevant standard error of measurement (SEM) is the SEM at the passing score. If the test is highly stratified, this SEM should be estimated by a split-halves approach. A formula and its derivation are provided. (Author)
Descriptors: Cutting Scores, Error of Measurement, Estimation (Mathematics), Mathematical Formulas
Peer reviewed Peer reviewed
Whitely, Susan E. – Journal of Educational Measurement, 1977
A debate concerning specific issues and the general usefulness of the Rasch latent trait test model is continued. Methods of estimation, necessary sample size, and the applicability of the model are discussed. (JKS)
Descriptors: Error of Measurement, Item Analysis, Mathematical Models, Measurement
Peer reviewed Peer reviewed
Woodruff, David – Journal of Educational Measurement, 1991
Improvements are made on previous estimates for the conditional standard error of measurement in prediction, the conditional standard error of estimation (CSEE), and the conditional standard error of prediction (CSEP). Better estimates of how test length affects CSEE and CSEP are derived. (SLD)
Descriptors: Equations (Mathematics), Error of Measurement, Estimation (Mathematics), Mathematical Models
Peer reviewed Peer reviewed
Wright, Benjamin D. – Journal of Educational Measurement, 1977
Statements made in a previous article of this journal concerning the Rasch latent trait test model are questioned. Methods of estimation, necessary sample sizes, several formuli, and the general usefulness of the Rasch model are discussed. (JKS)
Descriptors: Computers, Error of Measurement, Item Analysis, Mathematical Models