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| Error Patterns | 1 |
| Error of Measurement | 1 |
| Goodness of Fit | 1 |
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Peer reviewedTatsuoka, Kikumi, K.; Tatsuoka, Maurice M. – Journal of Educational Statistics, 1982
Two indices for measuring the degree of conformity or consistency of an individual examinee's response pattern on a set of items are developed. The use of the indices for spotting aberrant response patterns of examinees is detailed. (Author/JKS)
Descriptors: Error of Measurement, Error Patterns, Goodness of Fit, Item Analysis
