Descriptor
| Error of Measurement | 1 |
| Latent Trait Theory | 1 |
| Maximum Likelihood Statistics | 1 |
| Psychometrics | 1 |
| Test Format | 1 |
| Test Interpretation | 1 |
| Test Reliability | 1 |
| Test Theory | 1 |
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| Journal of Educational… | 1 |
Author
| Morgan, Anne | 1 |
| Wainer, Howard | 1 |
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| Journal Articles | 1 |
| Reports - Research | 1 |
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Peer reviewedMorgan, Anne; Wainer, Howard – Journal of Educational Statistics, 1980
Two estimation procedures for the Rasch Model of test analysis are reviewed in detail, particularly with respect to new developments that make the more statistically rigorous conditional maximum likelihood estimation practical for use with longish tests. (Author/JKS)
Descriptors: Error of Measurement, Latent Trait Theory, Maximum Likelihood Statistics, Psychometrics
