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Liang, Longjuan; Browne, Michael W. – Journal of Educational and Behavioral Statistics, 2015
If standard two-parameter item response functions are employed in the analysis of a test with some newly constructed items, it can be expected that, for some items, the item response function (IRF) will not fit the data well. This lack of fit can also occur when standard IRFs are fitted to personality or psychopathology items. When investigating…
Descriptors: Item Response Theory, Statistical Analysis, Goodness of Fit, Bayesian Statistics
Bartolucci, Francesco; Pennoni, Fulvia; Vittadini, Giorgio – Journal of Educational and Behavioral Statistics, 2016
We extend to the longitudinal setting a latent class approach that was recently introduced by Lanza, Coffman, and Xu to estimate the causal effect of a treatment. The proposed approach enables an evaluation of multiple treatment effects on subpopulations of individuals from a dynamic perspective, as it relies on a latent Markov (LM) model that is…
Descriptors: Causal Models, Markov Processes, Longitudinal Studies, Probability
Reardon, Sean F.; Ho, Andrew D. – Journal of Educational and Behavioral Statistics, 2015
In an earlier paper, we presented methods for estimating achievement gaps when test scores are coarsened into a small number of ordered categories, preventing fine-grained distinctions between individual scores. We demonstrated that gaps can nonetheless be estimated with minimal bias across a broad range of simulated and real coarsened data…
Descriptors: Achievement Gap, Performance Factors, Educational Practices, Scores
Guo, Hongwen; Sinharay, Sandip – Journal of Educational and Behavioral Statistics, 2011
Nonparametric or kernel regression estimation of item response curves (IRCs) is often used in item analysis in testing programs. These estimates are biased when the observed scores are used as the regressor because the observed scores are contaminated by measurement error. Accuracy of this estimation is a concern theoretically and operationally.…
Descriptors: Testing Programs, Measurement, Item Analysis, Error of Measurement