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Paganin, Sally; Paciorek, Christopher J.; Wehrhahn, Claudia; Rodríguez, Abel; Rabe-Hesketh, Sophia; de Valpine, Perry – Journal of Educational and Behavioral Statistics, 2023
Item response theory (IRT) models typically rely on a normality assumption for subject-specific latent traits, which is often unrealistic in practice. Semiparametric extensions based on Dirichlet process mixtures (DPMs) offer a more flexible representation of the unknown distribution of the latent trait. However, the use of such models in the IRT…
Descriptors: Bayesian Statistics, Item Response Theory, Guidance, Evaluation Methods
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Köhler, Carmen; Robitzsch, Alexander; Hartig, Johannes – Journal of Educational and Behavioral Statistics, 2020
Testing whether items fit the assumptions of an item response theory model is an important step in evaluating a test. In the literature, numerous item fit statistics exist, many of which show severe limitations. The current study investigates the root mean squared deviation (RMSD) item fit statistic, which is used for evaluating item fit in…
Descriptors: Test Items, Goodness of Fit, Statistics, Bias
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Kang, Hyeon-Ah; Zheng, Yi; Chang, Hua-Hua – Journal of Educational and Behavioral Statistics, 2020
With the widespread use of computers in modern assessment, online calibration has become increasingly popular as a way of replenishing an item pool. The present study discusses online calibration strategies for a joint model of responses and response times. The study proposes likelihood inference methods for item paramter estimation and evaluates…
Descriptors: Adaptive Testing, Computer Assisted Testing, Item Response Theory, Reaction Time
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van der Linden, Wim J.; Ren, Hao – Journal of Educational and Behavioral Statistics, 2020
The Bayesian way of accounting for the effects of error in the ability and item parameters in adaptive testing is through the joint posterior distribution of all parameters. An optimized Markov chain Monte Carlo algorithm for adaptive testing is presented, which samples this distribution in real time to score the examinee's ability and optimally…
Descriptors: Bayesian Statistics, Adaptive Testing, Error of Measurement, Markov Processes
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Giada Spaccapanico Proietti; Mariagiulia Matteucci; Stefania Mignani; Bernard P. Veldkamp – Journal of Educational and Behavioral Statistics, 2024
Classical automated test assembly (ATA) methods assume fixed and known coefficients for the constraints and the objective function. This hypothesis is not true for the estimates of item response theory parameters, which are crucial elements in test assembly classical models. To account for uncertainty in ATA, we propose a chance-constrained…
Descriptors: Automation, Computer Assisted Testing, Ambiguity (Context), Item Response Theory
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Jiang, Yu; Zhang, Jiahui; Xin, Tao – Journal of Educational and Behavioral Statistics, 2019
This article is an overview of the National Assessment of Education Quality (NAEQ) of China in reading, mathematics, sciences, arts, physical education, and moral education at Grades 4 and 8. After a review of the background and history of NAEQ, we present the assessment framework with students' holistic development at the core and the design for…
Descriptors: Foreign Countries, Educational Quality, Educational Improvement, National Competency Tests
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Martin, Michael O.; Mullis, Ina V. S. – Journal of Educational and Behavioral Statistics, 2019
International large-scale assessments of student achievement such as International Association for the Evaluation of Educational Achievement's Trends in International Mathematics and Science Study (TIMSS) and Progress in International Reading Literacy Study and Organization for Economic Cooperation and Development's Program for International…
Descriptors: Achievement Tests, International Assessment, Mathematics Tests, Science Achievement
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Culpepper, Steven Andrew – Journal of Educational and Behavioral Statistics, 2015
A Bayesian model formulation of the deterministic inputs, noisy "and" gate (DINA) model is presented. Gibbs sampling is employed to simulate from the joint posterior distribution of item guessing and slipping parameters, subject attribute parameters, and latent class probabilities. The procedure extends concepts in Béguin and Glas,…
Descriptors: Bayesian Statistics, Models, Sampling, Computation
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von Davier, Matthias; Sinharay, Sandip – Journal of Educational and Behavioral Statistics, 2007
Reporting methods used in large-scale assessments such as the National Assessment of Educational Progress (NAEP) rely on latent regression models. To fit the latent regression model using the maximum likelihood estimation technique, multivariate integrals must be evaluated. In the computer program MGROUP used by the Educational Testing Service for…
Descriptors: Simulation, Computer Software, Sampling, Data Analysis
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Bradlow, Eric T. – Journal of Educational and Behavioral Statistics, 1996
The three-parameter logistic (3-PL) model is described and a derivation of the 3-PL observed information function is presented for a single binary response from one examinee with known item parameters. Formulas are presented for the probability of negative information and for the expected information (always nonnegative). (SLD)
Descriptors: Ability, Adaptive Testing, Computer Assisted Testing, Item Response Theory
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Thomas, Neal; Gan, Nianci – Journal of Educational and Behavioral Statistics, 1997
Describes and assesses missing data methods currently used to analyze data from matrix sampling designs implemented by the National Assessment of Educational Progress. Several improved methods are developed, and these models are evaluated using an EM algorithm to obtain maximum likelihood estimates followed by multiple imputation of complete data…
Descriptors: Data Analysis, Item Response Theory, Matrices, Maximum Likelihood Statistics