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On Using Stochastic Curtailment to Shorten the SPRT in Sequential Mastery Testing
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Finkelman, Matthew – Journal of Educational and Behavioral Statistics, 2008
Sequential mastery testing (SMT) has been researched as an efficient alternative to paper-and-pencil testing for pass/fail examinations. One popular method for determining when to cease examination in SMT is the truncated sequential probability ratio test (TSPRT). This article introduces the application of stochastic curtailment in SMT to shorten…
Descriptors: Mastery Tests, Sequential Approach, Computer Assisted Testing, Adaptive Testing