Improved Type I Error Control and Reduced Estimation Bias for DIF Detection Using SIBTEST.

Jiang, Hai; Stout, William

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Peer reviewed

ERIC Number: EJ582926

Record Type: Journal

Publication Date: 1998

Pages: N/A

Abstractor: N/A

ISBN: N/A

ISSN: ISSN-1076-9986

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Improved Type I Error Control and Reduced Estimation Bias for DIF Detection Using SIBTEST.

Jiang, Hai; Stout, William

Journal of Educational and Behavioral Statistics, v23 n4 p291-322 Win 1998

Proposes a new regression correction for the SIBTEST statistical tests (R. Shealy and W. Stout, 1993) that essentially uses a two-segment piecewise linear regression of the true on observed matching subtest scores. A simulation study illustrates the approach. (SLD)

Descriptors: Estimation (Mathematics), Item Bias, Regression (Statistics), Simulation, True Scores

Publication Type: Journal Articles; Reports - Descriptive

Education Level: N/A

Audience: N/A

Language: English

Sponsor: N/A

Authoring Institution: N/A

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Author Affiliations: N/A