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Pleskac, Timothy J.; Dougherty, Michael R.; Rivadeneira, A. Walkyria; Wallsten, Thomas S. – Journal of Memory and Language, 2009
Theories of confidence judgments have embraced the role random error plays in influencing responses. An important next step is to identify the source(s) of these random effects. To do so, we used the stochastic judgment model (SJM) to distinguish the contribution of encoding and retrieval processes. In particular, we investigated whether dividing…
Descriptors: Error Patterns, Models, Cognitive Processes, Task Analysis
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Milin, Petar; Filipovic Durdevic, Dusica; Moscoso del Prado Martin, Fermin – Journal of Memory and Language, 2009
In this study, we investigate the relevance of inflectional paradigms and inflectional classes for lexical processing. We provide an information-theoretical measure of the divergence in the frequency distributions of two of the paradigms to which a word simultaneously belongs: the paradigm of the stem and the more general paradigm of the nominal…
Descriptors: Models, Form Classes (Languages), Linguistic Theory, Language Processing
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Stemberger, Joseph Paul – Journal of Memory and Language, 2007
Overtensing (the use of an inflected form in place of a nonfinite form, e.g. *"didn't broke" for target "didn't break") is common in early syntax. In a ChiLDES-based study of 36 children acquiring English, I examine the effects of phonological and lexical factors. For irregulars, errors are more common with verbs of low frequency and when…
Descriptors: Syntax, Rhyme, Morphemes, Error Patterns
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Page, Mike P. A.; Madge, Alison; Cumming, Nick; Norris, Dennis G. – Journal of Memory and Language, 2007
In three experiments, we tested the hypothesis that those errors in immediate serial recall (ISR) that are attributable to phonological confusability share a locus with segmental errors in normal speech production. In the first two experiments, speech errors were elicited in the repeated paced reading of six-letter lists. The errors mirrored the…
Descriptors: Phonology, Short Term Memory, Hypothesis Testing, Error Patterns