An Analysis of Difference Score Reliabilities on Three Measures with a Sample of Low-Achieving Youngsters.

Algozzine, Bob; Ysseldyke, James E.

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Peer reviewed

ERIC Number: EJ243614

Record Type: CIJE

Publication Date: 1981-Apr

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An Analysis of Difference Score Reliabilities on Three Measures with a Sample of Low-Achieving Youngsters.

Algozzine, Bob; Ysseldyke, James E.

Psychology in the Schools, v18 n2 p133-38 Apr 1981

Ability-achievement discrepancies were analyzed using the Woodcock-Johnson Psycho-Educational Battery, WISC-R, and the Peabody Individual Achievement Test administered to a sample of low achievers. Reliabilities of difference scores were moderately high. Reliabilities of differences for devices normed on both the same and different populations were comparable. (Author)

Descriptors: Academic Ability, Academic Aptitude, Comparative Analysis, Educational Diagnosis, Elementary Education, Elementary School Students, Learning Disabilities, Low Achievement, Psychometrics, Scores, Test Reliability

Publication Type: Journal Articles; Reports - Research

Education Level: N/A

Audience: N/A

Language: English

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