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Classification2
Mastery Tests2
Test Reliability2
Academic Standards1
Career Development1
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Cutting Scores1
Minimum Competencies1
Test Length1
Test Theory1
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Psychometrika2
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Huynh, Huynh2
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Reliability of Multiple Classifications.
Peer reviewed Peer reviewed
Huynh, Huynh – Psychometrika, 1978
The use of Cohen's kappa index as a measure of the reliability of multiple classifications is developed. Special cases of the index as well as the effects of test length on the index are also explored. (JKS)
Descriptors: Career Development, Classification, Mastery Tests, Test Length
A Nonrandomized Minimax Solution for Passing Scores in the Binomial Error Model.
Peer reviewed Peer reviewed
Huynh, Huynh – Psychometrika, 1980
A nonrandomized minimax solution is presented for passing scores on mastery tests using the binomial error model. The computation does not require prior knowledge regarding an individual examinee or group test data for a population of examinees. A scheme which allows for correction for guessing is also described. (Author/JKS)
Descriptors: Academic Standards, Classification, Criterion Referenced Tests, Cutting Scores