Fit of Different Models for Multitrait-Multimethod Experiments.

Corten, Irmgard W.; Saris, Willem E.; Coenders, Germa; van der Veld, William; Aalberts, Chris E.; Kornelis, Charles

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Peer reviewed

ERIC Number: EJ651462

Record Type: Journal

Publication Date: 2002

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ISSN: ISSN-1070-5511

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Fit of Different Models for Multitrait-Multimethod Experiments.

Corten, Irmgard W.; Saris, Willem E.; Coenders, Germa; van der Veld, William; Aalberts, Chris E.; Kornelis, Charles

Structural Equation Modeling, v9 n2 p213-32 2002

Compared different models suggested for the analysis of multitrait multimethod (MTMM) experiments for their fit to 87 data sets collected in the United States. The fit of models based on polychoric correlations is much worse than the fit of models based on product moment correlations, but in both cases a model that assumes additive method effects fits most data sets better than other models. (SLD)

Descriptors: Correlation, Goodness of Fit, Multitrait Multimethod Techniques

Publication Type: Journal Articles; Reports - Research

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Language: English

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