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Bradlow, Eric T. – Journal of Educational and Behavioral Statistics, 1996
The three-parameter logistic (3-PL) model is described and a derivation of the 3-PL observed information function is presented for a single binary response from one examinee with known item parameters. Formulas are presented for the probability of negative information and for the expected information (always nonnegative). (SLD)
Descriptors: Ability, Adaptive Testing, Computer Assisted Testing, Item Response Theory
Peer reviewed Peer reviewed
Veerkamp, Wim J. J. – Journal of Educational and Behavioral Statistics, 2000
Showed how Taylor approximation can be used to generate a linear approximation to a logistic item characteristic curve and a linear ability estimator. Demonstrated how, for a specific simulation, this could result in the special case of a Robbins-Monro item selection procedure for adaptive testing. (SLD)
Descriptors: Ability, Adaptive Testing, Computer Assisted Testing, Selection
Peer reviewed Peer reviewed
van der Linden, Wim J. – Journal of Educational and Behavioral Statistics, 1999
Proposes an algorithm that minimizes the asymptotic variance of the maximum-likelihood (ML) estimator of a linear combination of abilities of interest. The criterion results in a closed-form expression that is easy to evaluate. Also shows how the algorithm can be modified if the interest is in a test with a "simple ability structure."…
Descriptors: Ability, Adaptive Testing, Algorithms, Computer Assisted Testing
Peer reviewed Peer reviewed
Berger, Martijn P. F.; Veerkamp, Wim J. J. – Journal of Educational and Behavioral Statistics, 1997
Some alternative criteria for item selection in adaptive testing are proposed that take into account uncertainty in the ability estimates. A simulation study shows that the likelihood weighted information criterion is a good alternative to the maximum information criterion. Another good alternative uses a Bayesian expected a posteriori estimator.…
Descriptors: Ability, Adaptive Testing, Bayesian Statistics, Computer Assisted Testing