NotesFAQContact Us
Collection
Advanced
Search Tips
Showing all 4 results Save | Export
Peer reviewed Peer reviewed
Direct linkDirect link
Edwards, Oliver W.; Rottman, Amy – Journal of Instructional Psychology, 2011
To evaluate the implications of deliberate practice when teaching test administration skills, novice, but trained, graduate student examiners administered intelligence tests to a convenience sample of volunteer school-age examinees assigned to a first test session. A second, different convenience sample of volunteer school-age examinees were…
Descriptors: Graduate Students, Intelligence, Adaptive Testing, Intelligence Tests
Peer reviewed Peer reviewed
Reckase, Mark D. – Educational Measurement: Issues and Practice, 1989
Requirements for adaptive testing are reviewed, and the reasons implementation has taken so long are explored. The adaptive test is illustrated through the Stanford-Binet Intelligence Scale of L. M. Terman and M. A. Merrill (1960). Current adaptive testing is tied to the development of item response theory. (SLD)
Descriptors: Adaptive Testing, Educational Development, Elementary Secondary Education, Latent Trait Theory
Peer reviewed Peer reviewed
Cudeck, Robert; And Others – Applied Psychological Measurement, 1980
Tailored testing by Cliff's method of implied orders was simulated through the use of responses gathered during conventional administration of the Stanford-Binet Intelligence Scale. Tailoring eliminated approximately half the responses with only modest decreases in score reliability. (Author/BW)
Descriptors: Adaptive Testing, Computer Assisted Testing, Elementary Secondary Education, Intelligence Tests
Cliff, Norman; And Others – 1977
TAILOR is a computer program that uses the implied orders concept as the basis for computerized adaptive testing. The basic characteristics of TAILOR, which does not involve pretesting, are reviewed here and two studies of it are reported. One is a Monte Carlo simulation based on the four-parameter Birnbaum model and the other uses a matrix of…
Descriptors: Adaptive Testing, Computer Assisted Testing, Computer Programs, Difficulty Level