Descriptor
| Adaptive Testing | 2 |
| Latent Trait Theory | 2 |
| Test Construction | 2 |
| Testing | 2 |
| Algorithms | 1 |
| Bayesian Statistics | 1 |
| Computer Assisted Testing | 1 |
| Educational Assessment | 1 |
| Equated Scores | 1 |
| Item Analysis | 1 |
| Item Banks | 1 |
| More ▼ | |
Source
| Applied Psychological… | 2 |
Publication Type
| Collected Works - Serials | 2 |
| Journal Articles | 2 |
Education Level
Audience
Location
Laws, Policies, & Programs
Assessments and Surveys
What Works Clearinghouse Rating
Peer reviewedHambleton, Ronald K., Ed.; van der Linden, Wim J., Ed. – Applied Psychological Measurement, 1982
Item response theory (IRT) is having a major impact on the field of testing. This special issue presents an introduction and seven papers concerning developments in IRT applications. Some important IRT research being conducted outside the United States is highlighted. (SLD)
Descriptors: Adaptive Testing, Equated Scores, Item Analysis, Latent Trait Theory
Peer reviewedvan der Linden, Wim J., Ed. – Applied Psychological Measurement, 1986
New theory and practice in testing is replacing the standard test by the test item bank and classical test theory by item response theory. Eight papers and a commentary are presented in this special issue concerning test item banking. (SLD)
Descriptors: Adaptive Testing, Algorithms, Bayesian Statistics, Computer Assisted Testing
