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Yao, Yuling; Vehtari, Aki; Gelman, Andrew – Grantee Submission, 2022
When working with multimodal Bayesian posterior distributions, Markov chain Monte Carlo (MCMC) algorithms have difficulty moving between modes, and default variational or mode-based approximate inferences will understate posterior uncertainty. And, even if the most important modes can be found, it is difficult to evaluate their relative weights in…
Descriptors: Bayesian Statistics, Computation, Markov Processes, Monte Carlo Methods
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Lokkila, Erno; Christopoulos, Athanasios; Laakso, Mikko-Jussi – Informatics in Education, 2023
Prior programming knowledge of students has a major impact on introductory programming courses. Those with prior experience often seem to breeze through the course. Those without prior experience see others breeze through the course and disengage from the material or drop out. The purpose of this study is to demonstrate that novice student…
Descriptors: Prior Learning, Programming, Computer Science Education, Markov Processes
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Li, Xiao; Xu, Hanchen; Zhang, Jinming; Chang, Hua-hua – Journal of Educational and Behavioral Statistics, 2023
The adaptive learning problem concerns how to create an individualized learning plan (also referred to as a learning policy) that chooses the most appropriate learning materials based on a learner's latent traits. In this article, we study an important yet less-addressed adaptive learning problem--one that assumes continuous latent traits.…
Descriptors: Learning Processes, Models, Algorithms, Individualized Instruction
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Feng, Mingyu, Ed.; Käser, Tanja, Ed.; Talukdar, Partha, Ed. – International Educational Data Mining Society, 2023
The Indian Institute of Science is proud to host the fully in-person sixteenth iteration of the International Conference on Educational Data Mining (EDM) during July 11-14, 2023. EDM is the annual flagship conference of the International Educational Data Mining Society. The theme of this year's conference is "Educational data mining for…
Descriptors: Information Retrieval, Data Analysis, Computer Assisted Testing, Cheating