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Direct linkCole, Brian S.; Lima-Walton, Elia; Brunnert, Kim; Vesey, Winona Burt; Raha, Kaushik – Journal of Applied Testing Technology, 2020
Automatic item generation can rapidly generate large volumes of exam items, but this creates challenges for assembly of exams which aim to include syntactically diverse items. First, we demonstrate a diminishing marginal syntactic return for automatic item generation using a saturation detection approach. This analysis can help users of automatic…
Descriptors: Artificial Intelligence, Automation, Test Construction, Test Items
