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ERIC Number: EJ1470346
Record Type: Journal
Publication Date: 2025-May
Pages: 20
Abstractor: As Provided
ISBN: N/A
ISSN: ISSN-1360-2357
EISSN: EISSN-1573-7608
Available Date: 2024-12-02
Smart Proctoring with Automated Anomaly Detection
Pu Wang1; Yifeng Lin2; Tiesong Zhao2
Education and Information Technologies, v30 n7 p9269-9288 2025
With the emergence of Artificial Intelligence (AI), smart education has become an attractive topic. In a smart education system, automated classrooms and examination rooms could help reduce the economic cost of teaching, and thus improve teaching efficiency. However, existing AI algorithms suffer from low surveillance accuracies and high computational costs, which affect their practicability in real-word scenarios. To address this issue, we propose an AI-driven anomaly detection framework for smart proctoring. The proposed method, namely, Smart Exam (SmartEx), consists of two artificial neural networks: an object recognition network to locate invigilators and examinees, and a behavior analytics network to detect anomalies of examinees during the exam. To validate the performance of our method, we construct a dataset by annotating 6,429 invigilator instances, 34,074 examinee instances and 8 types of behaviors with 267,888 instances. Comprehensive experiments on the dataset show the superiority of our SmartEx method, with a superior proctoring performance and a relatively low computational cost. Besides, we also examine the pre-trained SmartEx in an examination room in our university, which shows high robustness to identify diversified anomalies in real-world scenarios.
Springer. Available from: Springer Nature. One New York Plaza, Suite 4600, New York, NY 10004. Tel: 800-777-4643; Tel: 212-460-1500; Fax: 212-460-1700; e-mail: customerservice@springernature.com; Web site: https://link.springer.com/
Publication Type: Journal Articles; Reports - Research
Education Level: Higher Education; Postsecondary Education
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A
Author Affiliations: 1Xiamen University, Institute of Education, Xiamen, China; 2Fuzhou University, College of Physics and Information Engineering, Fuzhou, China