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van der Linden, Wim J.; Ren, Hao – Journal of Educational and Behavioral Statistics, 2020
The Bayesian way of accounting for the effects of error in the ability and item parameters in adaptive testing is through the joint posterior distribution of all parameters. An optimized Markov chain Monte Carlo algorithm for adaptive testing is presented, which samples this distribution in real time to score the examinee's ability and optimally…
Descriptors: Bayesian Statistics, Adaptive Testing, Error of Measurement, Markov Processes
Geerlings, Hanneke; Glas, Cees A. W.; van der Linden, Wim J. – Psychometrika, 2011
An application of a hierarchical IRT model for items in families generated through the application of different combinations of design rules is discussed. Within the families, the items are assumed to differ only in surface features. The parameters of the model are estimated in a Bayesian framework, using a data-augmented Gibbs sampler. An obvious…
Descriptors: Simulation, Intelligence Tests, Item Response Theory, Models
van der Linden, Wim J.; Klein Entink, Rinke H.; Fox, Jean-Paul – Applied Psychological Measurement, 2010
Hierarchical modeling of responses and response times on test items facilitates the use of response times as collateral information in the estimation of the response parameters. In addition to the regular information in the response data, two sources of collateral information are identified: (a) the joint information in the responses and the…
Descriptors: Item Response Theory, Reaction Time, Computation, Bayesian Statistics
van der Linden, Wim J.; Guo, Fanmin – Psychometrika, 2008
In order to identify aberrant response-time patterns on educational and psychological tests, it is important to be able to separate the speed at which the test taker operates from the time the items require. A lognormal model for response times with this feature was used to derive a Bayesian procedure for detecting aberrant response times.…
Descriptors: Adaptive Testing, Bayesian Statistics, Reaction Time, College Entrance Examinations
van der Linden, Wim J. – Applied Psychological Measurement, 2009
An adaptive testing method is presented that controls the speededness of a test using predictions of the test takers' response times on the candidate items in the pool. Two different types of predictions are investigated: posterior predictions given the actual response times on the items already administered and posterior predictions that use the…
Descriptors: Simulation, Adaptive Testing, Vocational Aptitude, Bayesian Statistics
van der Linden, Wim J. – Journal of Educational and Behavioral Statistics, 2008
Response times on items can be used to improve item selection in adaptive testing provided that a probabilistic model for their distribution is available. In this research, the author used a hierarchical modeling framework with separate first-level models for the responses and response times and a second-level model for the distribution of the…
Descriptors: Reaction Time, Law Schools, Adaptive Testing, Item Analysis

van der Linden, Wim J.; Vos, Hans J. – Psychometrika, 1996
A Bayesian approach for simultaneous optimization of test-based decisions is presented using the example of a selection decision for a treatment followed by a mastery decision. A distinction is made between weak and strong rules, and conditions for monotonicity of optimal weak and strong rules are presented. (Author/SLD)
Descriptors: Bayesian Statistics, Decision Making, Scores, Selection
van der Linden, Wim J.; Vos, Hans J. – 1994
This paper presents some Bayesian theories of simultaneous optimization of decision rules for test-based decisions. Simultaneous decision making arises when an institution has to make a series of selection, placement, or mastery decisions with respect to subjects from a population. An obvious example is the use of individualized instruction in…
Descriptors: Bayesian Statistics, Decision Making, Foreign Countries, Scores
Glas, Cees A. W.; van der Linden, Wim J. – 2001
In some areas of measurement item parameters should not be modeled as fixed but as random. Examples of such areas are: item sampling, computerized item generation, measurement with substantial estimation error in the item parameter estimates, and grouping of items under a common stimulus or in a common context. A hierarchical version of the…
Descriptors: Bayesian Statistics, Estimation (Mathematics), Item Response Theory, Markov Processes

van der Linden, Wim J. – Psychometrika, 1998
This paper suggests several item selection criteria for adaptive testing that are all based on the use of the true posterior. Some of the ability estimators produced by these criteria are discussed and empirically criticized. (SLD)
Descriptors: Ability, Adaptive Testing, Bayesian Statistics, Computer Assisted Testing

van der Linden, Wim J.; Eggen, Theo J. H. M. – 1986
A procedure for the sequential optimization of the calibration of an item bank is given. The procedure is based on an empirical Bayes approach to a reformulation of the Rasch model as a model for paired comparisons between the difficulties of test items in which ties are allowed to occur. First, it is indicated how a paired-comparisons design…
Descriptors: Bayesian Statistics, Foreign Countries, Item Banks, Latent Trait Theory

van der Linden, Wim J. – Applied Psychological Measurement, 1999
Proposes a procedure for empirical initialization of the trait (theta) estimator in adaptive testing that is based on the statistical relation between theta and background variables known prior to test administration. Illustrates the procedure for an adaptive version of a test from the Dutch General Aptitude Battery. (SLD)
Descriptors: Adaptive Testing, Aptitude Tests, Bayesian Statistics, Computer Assisted Testing

van der Linden, Wim J. – 1984
The classification problem in educational testing is a decision problem. One must assign subjects to one of several available treatments on the basis of test scores, where the success of each treatment is measured by a different criterion. Examples of classification decisions include individualized instruction, counseling, and clinical settings.…
Descriptors: Bayesian Statistics, Classification, Cutting Scores, Decision Making
Glas, Cees A. W.; van der Linden, Wim J. – 2001
To reduce the cost of item writing and to enhance the flexibility of item presentation, items can be generated by item-cloning techniques. An important consequence of cloning is that it may cause variability on the item parameters. Therefore, a multilevel item response model is presented in which it is assumed that the item parameters of a…
Descriptors: Adaptive Testing, Bayesian Statistics, Computer Assisted Testing, Costs
van der Linden, Wim J. – 1996
R. J. Owen (1975) proposed an approximate empirical Bayes procedure for item selection in adaptive testing. The procedure replaces the true posterior by a normal approximation with closed-form expressions for its first two moments. This approximation was necessary to minimize the computational complexity involved in a fully Bayesian approach, but…
Descriptors: Ability, Adaptive Testing, Bayesian Statistics, Computation
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