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Srikanth Allamsetty; M. V. S. S. Chandra; Neelima Madugula; Byamakesh Nayak – IEEE Transactions on Learning Technologies, 2024
The present study is related to the problem associated with student assessment with online examinations at higher educational institutes (HEIs). With the current COVID-19 outbreak, the majority of educational institutes are conducting online examinations to assess their students, where there would always be a chance that the students go for…
Descriptors: Computer Assisted Testing, Accountability, Higher Education, Comparative Analysis
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Fuchimoto, Kazuma; Ishii, Takatoshi; Ueno, Maomi – IEEE Transactions on Learning Technologies, 2022
Educational assessments often require uniform test forms, for which each test form has equivalent measurement accuracy but with a different set of items. For uniform test assembly, an important issue is the increase of the number of assembled uniform tests. Although many automatic uniform test assembly methods exist, the maximum clique algorithm…
Descriptors: Simulation, Efficiency, Test Items, Educational Assessment
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Liu, Ming; Rus, Vasile; Liu, Li – IEEE Transactions on Learning Technologies, 2018
Automatic question generation can help teachers to save the time necessary for constructing examination papers. Several approaches were proposed to automatically generate multiple-choice questions for vocabulary assessment or grammar exercises. However, most of these studies focused on generating questions in English with a certain similarity…
Descriptors: Multiple Choice Tests, Regression (Statistics), Test Items, Natural Language Processing
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Ishii, Takatoshi; Songmuang, Pokpong; Ueno, Maomi – IEEE Transactions on Learning Technologies, 2014
Educational assessments occasionally require uniform test forms for which each test form comprises a different set of items, but the forms meet equivalent test specifications (i.e., qualities indicated by test information functions based on item response theory). We propose two maximum clique algorithms (MCA) for uniform test form assembly. The…
Descriptors: Simulation, Efficiency, Test Items, Educational Assessment