Publication Date
In 2025 | 0 |
Since 2024 | 0 |
Since 2021 (last 5 years) | 0 |
Since 2016 (last 10 years) | 1 |
Since 2006 (last 20 years) | 3 |
Descriptor
Comparative Analysis | 3 |
Error Patterns | 3 |
Evaluation Methods | 2 |
Sample Size | 2 |
Simulation | 2 |
Test Bias | 2 |
Test Items | 2 |
Chinese | 1 |
Computation | 1 |
Correlation | 1 |
Course Content | 1 |
More ▼ |
Source
International Journal of… | 3 |
Author
Guo, Xiuyan | 1 |
Lei, Pui-Wa | 1 |
Mapuranga, Raymond | 1 |
Oshima, T. C. | 1 |
White, Nick | 1 |
Wright, Keith | 1 |
Wyse, Adam E. | 1 |
Publication Type
Journal Articles | 3 |
Reports - Research | 2 |
Reports - Evaluative | 1 |
Education Level
High Schools | 1 |
Secondary Education | 1 |
Audience
Location
China | 1 |
Laws, Policies, & Programs
Assessments and Surveys
Program for International… | 1 |
What Works Clearinghouse Rating
Guo, Xiuyan; Lei, Pui-Wa – International Journal of Testing, 2020
Little research has been done on the effects of peer raters' quality characteristics on peer rating qualities. This study aims to address this gap and investigate the effects of key variables related to peer raters' qualities, including content knowledge, previous rating experience, training on rating tasks, and rating motivation. In an experiment…
Descriptors: Peer Evaluation, Error Patterns, Correlation, Knowledge Level
Oshima, T. C.; Wright, Keith; White, Nick – International Journal of Testing, 2015
Raju, van der Linden, and Fleer (1995) introduced a framework for differential functioning of items and tests (DFIT) for unidimensional dichotomous models. Since then, DFIT has been shown to be a quite versatile framework as it can handle polytomous as well as multidimensional models both at the item and test levels. However, DFIT is still limited…
Descriptors: Test Bias, Item Response Theory, Test Items, Simulation
Wyse, Adam E.; Mapuranga, Raymond – International Journal of Testing, 2009
Differential item functioning (DIF) analysis is a statistical technique used for ensuring the equity and fairness of educational assessments. This study formulates a new DIF analysis method using the information similarity index (ISI). ISI compares item information functions when data fits the Rasch model. Through simulations and an international…
Descriptors: Test Bias, Evaluation Methods, Test Items, Educational Assessment