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Zhang, Xue; Tao, Jian; Wang, Chun; Shi, Ning-Zhong – Journal of Educational Measurement, 2019
Model selection is important in any statistical analysis, and the primary goal is to find the preferred (or most parsimonious) model, based on certain criteria, from a set of candidate models given data. Several recent publications have employed the deviance information criterion (DIC) to do model selection among different forms of multilevel item…
Descriptors: Bayesian Statistics, Item Response Theory, Measurement, Models
Jiao, Hong; Wang, Shudong; He, Wei – Journal of Educational Measurement, 2013
This study demonstrated the equivalence between the Rasch testlet model and the three-level one-parameter testlet model and explored the Markov Chain Monte Carlo (MCMC) method for model parameter estimation in WINBUGS. The estimation accuracy from the MCMC method was compared with those from the marginalized maximum likelihood estimation (MMLE)…
Descriptors: Computation, Item Response Theory, Models, Monte Carlo Methods