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Direct linkLee, Wooyeol; Cho, Sun-Joo – Applied Measurement in Education, 2017
Utilizing a longitudinal item response model, this study investigated the effect of item parameter drift (IPD) on item parameters and person scores via a Monte Carlo study. Item parameter recovery was investigated for various IPD patterns in terms of bias and root mean-square error (RMSE), and percentage of time the 95% confidence interval covered…
Descriptors: Item Response Theory, Test Items, Bias, Computation
Rutkowski, Leslie – Applied Measurement in Education, 2014
Large-scale assessment programs such as the National Assessment of Educational Progress (NAEP), Trends in International Mathematics and Science Study (TIMSS), and Programme for International Student Assessment (PISA) use a sophisticated assessment administration design called matrix sampling that minimizes the testing burden on individual…
Descriptors: Measurement, Testing, Item Sampling, Computation
Murphy, Daniel L.; Beretvas, S. Natasha – Applied Measurement in Education, 2015
This study examines the use of cross-classified random effects models (CCrem) and cross-classified multiple membership random effects models (CCMMrem) to model rater bias and estimate teacher effectiveness. Effect estimates are compared using CTT versus item response theory (IRT) scaling methods and three models (i.e., conventional multilevel…
Descriptors: Teacher Effectiveness, Comparative Analysis, Hierarchical Linear Modeling, Test Theory
Finch, Holmes; Monahan, Patrick – Applied Measurement in Education, 2008
This article introduces a bootstrap generalization to the Modified Parallel Analysis (MPA) method of test dimensionality assessment using factor analysis. This methodology, based on the use of Marginal Maximum Likelihood nonlinear factor analysis, provides for the calculation of a test statistic based on a parametric bootstrap using the MPA…
Descriptors: Monte Carlo Methods, Factor Analysis, Generalization, Methods
