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Lin, Chuan-Ju – Journal of Technology, Learning, and Assessment, 2010
Assembling equivalent test forms with minimal test overlap across forms is important in ensuring test security. Chen and Lei (2009) suggested a exposure control technique to control test overlap-ordered item pooling on the fly based on the essence that test overlap rate--ordered item pooling for the first t examinees is a function of test overlap…
Descriptors: Test Length, Test Format, Evaluation Criteria, Psychometrics
Pommerich, Mary – Journal of Technology, Learning, and Assessment, 2007
Computer administered tests are becoming increasingly prevalent as computer technology becomes more readily available on a large scale. For testing programs that utilize both computer and paper administrations, mode effects are problematic in that they can result in examinee scores that are artificially inflated or deflated. As such, researchers…
Descriptors: Computer Assisted Testing, Adaptive Testing, Test Format, Scores