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Direct linkLaFlair, Geoffrey T.; Langenfeld, Thomas; Baig, Basim; Horie, André Kenji; Attali, Yigal; von Davier, Alina A. – Journal of Computer Assisted Learning, 2022
Background: Digital-first assessments leverage the affordances of technology in all elements of the assessment process--from design and development to score reporting and evaluation to create test taker-centric assessments. Objectives: The goal of this paper is to describe the engineering, machine learning, and psychometric processes and…
Descriptors: Computer Assisted Testing, Affordances, Scoring, Engineering
Hong Jiao, Editor; Robert W. Lissitz, Editor – IAP - Information Age Publishing, Inc., 2024
With the exponential increase of digital assessment, different types of data in addition to item responses become available in the measurement process. One of the salient features in digital assessment is that process data can be easily collected. This non-conventional structured or unstructured data source may bring new perspectives to better…
Descriptors: Artificial Intelligence, Natural Language Processing, Psychometrics, Computer Assisted Testing
Download full textHussein, Mohammed Juned; Yusuf, Javed; Deb, Arpana Sandhya; Fong, Letila; Naidu, Som – Open Praxis, 2020
COVID-19 is hastening the adoption of online learning and teaching worldwide, and across all levels of education. While many of the typical learning and teaching transactions such as lecturing and communicating are easily handled by contemporary online learning technologies, others, such as assessment of learning outcomes with closed book…
Descriptors: Computer Assisted Testing, Computer Software Evaluation, Supervision, Distance Education
Feng, Mingyu, Ed.; Käser, Tanja, Ed.; Talukdar, Partha, Ed. – International Educational Data Mining Society, 2023
The Indian Institute of Science is proud to host the fully in-person sixteenth iteration of the International Conference on Educational Data Mining (EDM) during July 11-14, 2023. EDM is the annual flagship conference of the International Educational Data Mining Society. The theme of this year's conference is "Educational data mining for…
Descriptors: Information Retrieval, Data Analysis, Computer Assisted Testing, Cheating
Edwards, Virginia B., Ed. – Education Week, 2014
Figuring out how to use digital tools to transform testing requires a willingness to invest in new technologies and the patience to experiment with novel approaches, a commitment to ongoing professional development and reliable technical support, and an openness to learn from mistakes. Whatever bumpy ride this technological journey takes, experts…
Descriptors: Elementary Secondary Education, Technological Advancement, Testing, Computer Assisted Testing
Hu, Xiangen, Ed.; Barnes, Tiffany, Ed.; Hershkovitz, Arnon, Ed.; Paquette, Luc, Ed. – International Educational Data Mining Society, 2017
The 10th International Conference on Educational Data Mining (EDM 2017) is held under the auspices of the International Educational Data Mining Society at the Optics Velley Kingdom Plaza Hotel, Wuhan, Hubei Province, in China. This years conference features two invited talks by: Dr. Jie Tang, Associate Professor with the Department of Computer…
Descriptors: Data Analysis, Data Collection, Graphs, Data Use
