Administrative problems such as computer malfunction and power outage occasionally lead to missing item scores and hence to incomplete data on mastery tests such as the AP and U.S. Medical Licensing examinations. Investigators are often interested in estimating the probabilities of passing of the examinees with incomplete data on mastery tests.…

In sequential mastery testing (SMT), assessment via computer is used to classify examinees into one of two mutually exclusive categories. Unlike paper-and-pencil tests, SMT has the capability to use variable-length stopping rules. One approach to shortening variable-length tests is stochastic curtailment, which halts examination if the probability…

Sequential mastery testing (SMT) has been researched as an efficient alternative to paper-and-pencil testing for pass/fail examinations. One popular method for determining when to cease examination in SMT is the truncated sequential probability ratio test (TSPRT). This article introduces the application of stochastic curtailment in SMT to shorten…

Expert systems can be used to aid decision making. A computerized adaptive test (CAT) is one kind of expert system, although it is not commonly recognized as such. A new approach, termed EXSPRT, was devised that combines expert systems reasoning and sequential probability ratio test stopping rules. EXSPRT-R uses random selection of test items,…

Discussion of expert systems and computerized adaptive tests describes two versions of EXSPRT, a new approach that combines uncertain inference in expert systems with sequential probability ratio test (SPRT) stopping rules. Results of two studies comparing EXSPRT to adaptive mastery testing based on item response theory and SPRT approaches are…

This paper describes two procedures for making binary classification decisions using tailored testing: the sequential probability ratio test (SPRT) and a Bayesian decision procedure. The first procedure described, the SPRT, was developed by Wald for quality control work. It has not been widely applied for testing applications because the…